Test Engineering

Manufacturing Test Process - Yield performance

Chipright’s Test engineers have vast experience in high volume production test, wafer test, for analog RF, Digital and mixed signal products. Chipright provide efficient and cost driven solutions, with a proven record of Test success to ensure the reliability of your product or device.

Our engineers can perform electrical bench and ATE analysis plus develop advanced testing techniques to detect soft/hard memory & scan fails. They have the ability to maintain tester operation and hardware debug, root cause investigation of FAB yield loss based on bin trends analysis. Our engineers are experienced in the preparation of test solutions and implementing quality assurance methods. They are experts in the development of characterization and production test programs for IC devices.

Our consultants are recognized as ATE experts, with experience in:

  • Advantest
  • Teradyne
  • Credence
  • Aeroflex
  • HP platforms
  • Extensive experience of test yield analysis and improvement ATE Software and Hardware Development
  • Labview


Chipright’s engineers work well in a team environment, capable of transferring and applying their knowledge to evolve the project to a successful outcome. They can work stand-alone either on-site or off-site as they are proactive problem solvers.

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